All repositoriesTSM / Open silicon
Silicon Foundry.
Compare defect-yield models and prototype run economics for a community-backed open-hardware experiment.
INSIDE THE REPOSITORY
A complete place to start.
- Wafer edge-loss approximation
- Poisson and clustered-defect models
- Prototype cost per expected good die
- Exact token contract and pair inspection
- Bounded ERC-20 transfer activity explorer
- Local community funding scenario planner
- Evidence export with SHA-256 verification
- Nine automated checks and GitHub CI
- MIT license, method, architecture and API docs
Run locally
npm test npm start
Open localhost:3000. The technology runs with no API key. Live chain and DNS reads use public providers.
Deploy in your account
Extract the archive and upload its contents to a GitHub repository you control. Import that repository into Vercel, or run npx vercel --prod in the extracted folder. The included configuration sets the output directory and tests.
Return to the Deploy studio to publish your project, token pair and repository on the public build board.
29 SOURCE FILES / V1.0.0
Inspect everything.
.env.example.github/workflows/check.yml.gitignoreLICENSEREADME.mdSECURITY.mdapi/activity.mjsapi/dns.mjsapi/health.mjsapi/token.mjsdev.mjsdocs/API.mddocs/ARCHITECTURE.mddocs/METHOD.mdexamples/inputs.jsonpackage.jsonpublic/app.mjspublic/config.mjspublic/core/engine.mjspublic/core/math.mjspublic/favicon.svgpublic/index.htmlpublic/styles.cssserver/api.mjsserver/handler.mjstests/api.test.mjstests/engine.test.mjstools/verify-evidence.mjsvercel.jsonThis download contains only this standalone project. It includes no account credentials.
METHOD
What it calculates.
Gross dies use wafer area minus edge loss. Poisson yield = exp(-D·A); negative-binomial yield = (1+D·A/alpha)^(-alpha). Cost divides run costs by expected good dies.
LIMITS
What the evidence means.
Excludes layout rules, scribe lanes, parametric yield, process qualification and real foundry quotes.
The funding planner does not transfer tokens or route rewards. Deploying this repository does not imply company endorsement or investment value.
Inputs you control.
| Input | Type | Units |
|---|---|---|
| Wafer diameter | Bounded number | mm |
| Die area | Bounded number | mm2 |
| Defect density | Bounded number | defects/cm2 |
| Clustering parameter | Bounded number | — |
| Wafer cost assumption | Bounded number | USD |
| Mask and setup budget | Bounded number | USD |
| Prototype wafers | Bounded number | — |