What it calculates
Gross dies use the standard edge-loss approximation. Yield is e^(−D₀A), where D₀ is defects/cm² and A is die area in cm².
Working now Starter lab / TSM
Forefront Silicon
Lab
Estimate gross dies per circular wafer, defect-limited yield and expected good dies from simple geometry and a Poisson defect model.
Working starter tool / v0.1
Wafer yield estimator
Estimate gross dies per circular wafer, defect-limited yield and expected good dies from simple geometry and a Poisson defect model.
What it does not prove
This is a first-order estimator. It excludes scribe lanes, edge exclusions, defect clustering, redundancy, parametric yield and process-specific layout effects.
Build on the mission
Use it, inspect it, prepare the next build.
Independent starter tool. This lab is functional software, but it is intentionally narrow and does not claim to complete the full Silicon Proof roadmap. Only openly licensed designs and non-sensitive manufacturing assumptions are accepted.